Publications

Surface slope measurement of steep silicon V-grooves using high NA Linnik interferometry

Marco Künne, Tobias Pahl, Luigi Ribotta, Andrea Giura, Massimo Zucco, Irdi Murataj, Federico Ferrarese Lupi, Peter Lehmann, Surface Topography: Metrology and Properties, 2025, DOI 10.1088/2051-672X/adae25

Calibration of atomic force microscope cantilevers based on μ-LDV: Metrological insight on the constitutive experimental parameters of Sader’s formula for spring constant

Alessandro Schiavi, Luigi Ribotta, Luca Bruno, Marco Pisani, Roberto Bellotti, Massimo Zucco, Fabrizio Mazzoleni, Alessio Facello, Andrea Prato, Measurement: Sensors, 2025, DOI 10.1016/j.measen.2024.101744

SurfILE: An Open-Source Python Package for Surface Topography Analysis

Andrea Giura, Massimo Zucco, Luigi Ribotta, Metrology, 4, 695-717, 2024, DOI 10.3390/metrology4040041

A quantitative approach to reflectance transformation imaging in profilometric applications

Eleonora Verni, Giacomo Fiocco, Emanuela Grifoni, Giulia Lippolis, Nicola Ludwig, Marco Malagodi, Marco Pisani, Tommaso Rovetta, Massimo Zucco, Marco Gargano. European Physical Journal - Plus 139, 807, 2024, DOI 10.1140/epjp/s13360-024-05522-3 

Early Biological Response to Poly (ε-Caprolactone)/Alumina-Toughened Zirconia Composites Obtained by 3D Printing for Peri-Implant Application

Riccardo Pedraza, Alessandro Mosca Balma, Ilaria Roato, Clarissa Orrico, Tullio Genova, Giacomo Baima, Giovanni Nicolao Berta, Andrea Giura, Luigi Ribotta, Donatella Duraccio, Maria Giulia Faga, Federico Mussano, Polymers, 16 (17) 2521, 2024, DOI 10.3390/polym16172521

AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires

Luigi Ribotta, Alexandra Delvallée, Eleonora Cara, Roberto Bellotti, Andrea Giura, Ivan De Carlo, Matteo Fretto, Walter Knulst, Richard Koops, Bruno Torre, Zineb Saghi, Luca Boarino. Measurement Science and Technology, Volume 35, Number 10, 2024, DOI 10.1088/1361-6501/ad5e9f

AFM measurements and tip characterization of nanoparticles with different shapes

Roberto Bellotti, Gian Bartolo Picotto, Luigi Ribotta, Nanomanufacting and Metrology 5, 127–138, 2022, DOI 10.1007/s41871-022-00125-x

Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy

Valter Maurino, Francesco Pellegrino, Gian Bartolo Picotto, Luigi Ribotta, Ultramicroscopy, 113480, 2022, DOI: 10.1016/j.ultramic.2022.113480

Tip–sample characterization in the AFM study of a rod-shaped nanostructure

Gian Bartolo Picotto, Marta Vallino, Luigi Ribotta, Measurement Science and Technology, Volume 31, 2020, DOI 10.1088/1361-6501/ab7bc2

Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells

Roberto Bellotti, Valentina Furin, Alessandro Marsura, Gian Bartolo Picotto, Luigi Ribotta, Surface Topography: Metrology and Properties, Volume 7, Number 3, 2019, DOI 10.1088/2051-672X/ab370e

A function-driven characterization of printed conductors on PV cells

Roberto Bellotti, Valentina Furin, Claire Maras, Gian Bartolo Picotto, Luigi Ribotta, Surface Topography: Metrology and Properties, Volume 6, Number 2, 2018, DOI 10.1088/2051-672X/aabe20