Publications
A quantitative approach to reflectance transformation imaging in profilometric applications
Eleonora Verni, Giacomo Fiocco, Emanuela Grifoni, Giulia Lippolis, Nicola Ludwig, Marco Malagodi, Marco Pisani, Tommaso Rovetta, Massimo Zucco, Marco Gargano. Eur. Phys. J. Plus 139, 807, 2024, DOI 10.1140/epjp/s13360-024-05522-3
Riccardo Pedraza, Alessandro Mosca Balma, Ilaria Roato, Clarissa Orrico, Tullio Genova, Giacomo Baima, Giovanni Nicolao Berta, Andrea Giura, Luigi Ribotta, Donatella Duraccio, Maria Giulia Faga, Federico Mussano, Polymers, 16 (17) 2521, 2024, DOI 10.3390/polym16172521
AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires
Luigi Ribotta, Alexandra Delvallée, Eleonora Cara, Roberto Bellotti, Andrea Giura, Ivan De Carlo, Matteo Fretto, Walter Knulst, Richard Koops, Bruno Torre, Zineb Saghi and Luca Boarino. Measurement Science and Technology, Volume 35, Number 10, 2024, DOI 10.1088/1361-6501/ad5e9f
AFM measurements and tip characterization of nanoparticles with different shapes
Roberto Bellotti, Gian Bartolo Picotto, Luigi Ribotta, Nanomanuf Metrol 5, 127–138, 2022, DOI 10.1007/s41871-022-00125-x
Valter Maurino, Francesco Pellegrino, Gian Bartolo Picotto, Luigi Ribotta, Ultramicroscopy, 2022, 113480, DOI: 10.1016/j.ultramic.2022.113480
Tip–sample characterization in the AFM study of a rod-shaped nanostructure
Gian Bartolo Picotto, Marta Vallino, Luigi Ribotta, Measurement Science and Technology, Volume 31, 2020, DOI 10.1088/1361-6501/ab7bc2
Roberto Bellotti, Valentina Furin, Alessandro Marsura, Gian Bartolo Picotto, Luigi Ribotta, Surface Topography: Metrology and Properties, Volume 7, Number 3, 2019, DOI 10.1088/2051-672X/ab370e
A function-driven characterization of printed conductors on PV cells
Roberto Bellotti, Valentina Furin, Claire Maras, Gian Bartolo Picotto, Luigi Ribotta, Surface Topography: Metrology and Properties, Volume 6, Number 2, 2018, DOI 10.1088/2051-672X/aabe20