Course objectives

The course aims at providing an introduction to the metrology field, underlying the importance of measurements and uncertainty in science and technology.

More in detail, the focus will be on nanometrology and on the quantitative analysis of nanoparticles.

Program

The topics covered will be the following:

• fundamentals of metrology

• uncertainty budget evaluation

• nanometrology and its application in the quantitative analysis of nanoparticles by means of AFM, SEM, TEM, SAXS and DLS techniques

• exemplary applications of Metrology in Chemistry, Biology, Materials Science and Quantum Technologies

Contact: l.ribotta@inrim.it

https://dott-scm.campusnet.unito.it/do/storicocorsi.pl/Show?_id=u62y_2324